The following published papers used
Electronic Structure Tools for data analysis:
R. H. French, “Origins and Applications of London Dispersion Forces and Hamaker Constants in
Ceramics”, Centennial Feature Article, Journal of the American Ceramic Society, 83, 9,
2117-46 (2000).
A. D. Dorneich, R. H. French, H. Müllejans, S. Loughin, M. Rühle, "Quantitative Analysis of Valence Electron Energy-Loss Spectra of Aluminum
Nitride", Journal of Microscopy, 191, 3, 286-96, (1998).
R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon, M. Rühle,
" Dispersion Forces and Hamaker
Constants for Intergranular Film in Silicon Nitride from Spatially
Resvolved-Valence Electron Energy Loss Spectrum
Imaging", Acta Materialia, 46, 7, 2271-87, (1998).
S. Loughin, R. H. French, L. K. DeNoyer, W. -Y. Ching, Y. -N. Xu, "Critical Point Analysis of the Interband Transition Strength of
Electrons", Journal of Physics D, 29 1740-50, (1996).
H. D. Ackler, R. H. French, Y. M. Chiang, " Comparison of Hamaker Constants for Ceramic Systems with Intervening
Vacuum or Water: From Force Laws and Physical Properties", Journal of Colloid and Interface Science, 179,
460-69, (1996).
C. Argento, R. H. French, " Parametric Tip Model and Force-Distance Relation for Hamaker Constant Determination
from AFM", Journal of Applied Physics, 80, 6081-90 (1996).
R. H. French, R. M. Cannon, L. K. DeNoyer, Y.-M. Chiang, "Full Spectral Calculation of Non-Retarded Hamaker Constants for Ceramic Systems from Interband Transition Strengths", Solid State Ionics, 75, 13-33, (1995).
Y. M. Chiang, L. E. Silverman, R. H. French, R. M. Cannon, "The Thin Glass Film between Ultrafine Conductor
Particles in Thick Film Resistors", Journal of the American Ceramics Society, 77, 1143-52, (1994).
For More Information Contact:
Deconvolution and Entropy Consulting
755 Snyder Hill, Ithaca NY 14850, USA
Tel: 607-272-6735
Internet: lkd1@cornell.edu
