The following published papers used
Electronic Structure Tools for data analysis:
R. H. French, “Origins and Applications of London Dispersion Forces and Hamaker Constants in
Ceramics”, Centennial Feature Article, Journal of the American Ceramic Society, 83, 9,
A. D. Dorneich, R. H. French, H. Müllejans, S. Loughin, M. Rühle, "Quantitative Analysis of Valence Electron Energy-Loss Spectra of Aluminum
Nitride", Journal of Microscopy, 191, 3, 286-96, (1998).
R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon, M. Rühle,
" Dispersion Forces and Hamaker
Constants for Intergranular Film in Silicon Nitride from Spatially
Resvolved-Valence Electron Energy Loss Spectrum
Imaging", Acta Materialia, 46, 7, 2271-87, (1998).
S. Loughin, R. H. French, L. K. DeNoyer, W. -Y. Ching, Y. -N. Xu, "Critical Point Analysis of the Interband Transition Strength of
Electrons", Journal of Physics D, 29 1740-50, (1996).
H. D. Ackler, R. H. French, Y. M. Chiang, " Comparison of Hamaker Constants for Ceramic Systems with Intervening
Vacuum or Water: From Force Laws and Physical Properties", Journal of Colloid and Interface Science, 179,
C. Argento, R. H. French, " Parametric Tip Model and Force-Distance Relation for Hamaker Constant Determination
from AFM", Journal of Applied Physics, 80, 6081-90 (1996).
R. H. French, R. M. Cannon, L. K. DeNoyer, Y.-M. Chiang, "Full Spectral Calculation of Non-Retarded Hamaker Constants for Ceramic Systems from Interband Transition Strengths", Solid State Ionics, 75, 13-33, (1995).
Y. M. Chiang, L. E. Silverman, R. H. French, R. M. Cannon, "The Thin Glass Film between Ultrafine Conductor
Particles in Thick Film Resistors", Journal of the American Ceramics Society, 77, 1143-52, (1994).
For More Information Contact:
Deconvolution and Entropy Consulting
755 Snyder Hill, Ithaca NY 14850, USA